L load testing device
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Our company handles an L load testing device that applies high voltage and high current to samples in the safe operating area (ASO) to check whether they are destroyed or not. An inductor (L) is connected to the drain as the load for the sample (DUT), and the input gate voltage is controlled to switch the DUT. The switching of the DUT generates a reverse voltage across the L load, and the voltage and current at this time are used to conduct a durability test on the DUT. 【Product Lineup】 ■FET-901 ■FET-902 ■FET-9205 ■EF-5002 *For more details, please feel free to contact us.
- Company：エルゴ電子
- Price：Other
